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SungJun Kim 2 Articles
Estimation of Transferred Power from a Noise Source to an IC with Forwarded Power Characteristics
Bo Pu, Taeho Kim, SungJun Kim, Jong-Hyeon Kim, SoYoung Kim, Wansoo Nah
J Electromagn Eng Sci. 2013;13(4):233-239.
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Modeling and Prediction of Electromagnetic Immunity for Integrated Circuits
Bo Pu, Taeho Kim, SungJun Kim, SoYoung Kim, Wansoo Nah
J Electromagn Eng Sci. 2013;13(1):54-62.
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