Modeling and Prediction of Electromagnetic Immunity for Integrated Circuits
Bo Pu, Taeho Kim, SungJun Kim, SoYoung Kim, Wansoo Nah
J Electromagn Eng Sci. 2013;13(1):54-62.     DOI: https://doi.org/10.5515/JKIEES.2013.13.1.54
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