Specular Reflectance Measurements of Dielectric Plates in Millimeter Frequency Range
Jin-Seob Kang, Jeong-Hwan Kim, Kwang Yong Kang, Dae Hwan Yoon, Sung Won Park
J. Electromagn. Eng. Sci. 2018;18(2):78-87.   Published online 2018 Apr 30     DOI: https://doi.org/10.26866/jees.2018.18.2.78
Citations to this article as recorded by Crossref logo
Free-Space Unknown Thru Measurement Using Planar Offset Short for Material Characterization
Jin-Seob Kang
Journal of Electromagnetic Engineering and Science.2022; 22(5): 555.     CrossRef
Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement
Jin-Seob Kang
Journal of Electromagnetic Engineering and Science.2022; 22(6): 656.     CrossRef
Complex Permittivity Measurement of Artificial Tissue Emulating Material Using Open-Ended Coaxial Probe
Jae-Yeon Shim, Jae-Young Chung
IEEE Sensors Journal.2020; 20(9): 4688.     CrossRef
All-Dielectric Transparent Metamaterial Absorber With Encapsulated Water
Qingmin Wang, Ke Bi, Sungjoon Lim
IEEE Access.2020; 8: 175998.     CrossRef