PublisherDOIYearVolumeIssuePageTitleAuthor(s)Link
Journal of Electromagnetic Engineering and Science10.26866/jees.2021.21.1.51202121151-59Planar Offset Short Applicable to the Calibration of a Free-Space Material Measurement System in W-BandJin-Seob Kang, Jeong-Hwan Kimhttp://jees.kr/upload/pdf/jees-2021-21-1-51.pdf, http://jees.kr/journal/view.php?doi=10.26866/jees.2021.21.1.51, http://jees.kr/upload/pdf/jees-2021-21-1-51.pdf
IEEE Transactions on Instrumentation and Measurement10.1109/19.8639392000494862-866Using offset parabolic reflector antennas for free space material measurementJ. Matlacz, D. Palmerhttp://xplorestaging.ieee.org/ielx5/19/18711/00863939.pdf?arnumber=863939
IEEE Transactions on Instrumentation and Measurement10.1109/19.69942199140119-24A free-space bistatic calibration technique for the measurement of parallel and perpendicular reflection coefficients of planar samplesM.H. Umari, D.K. Ghodgaonkar, V.V. Varadan, V.K. Varadanhttp://xplorestaging.ieee.org/ielx1/19/2452/00069942.pdf?arnumber=69942
IEEE Transactions on Instrumentation and Measurement10.1109/tim.2006.88428320065562022-2028A Quasi-Optical Free-Space Measurement Setup Without Time-Domain Gating for Material Characterization in the $W$-BandDaniel Bourreau, Alain Peden, Sandrick Le Maguerhttp://xplorestaging.ieee.org/ielx5/19/4014679/04014686.pdf?arnumber=4014686
IEEE Transactions on Instrumentation and Measurement10.1109/tim.2013.224690520136271982-1989Compact Unfocused Antenna Setup for X-Band Free-Space Dielectric Measurements Based on Line-Network-Network Calibration MethodChristian Orlob, Tobias Reinecke, Eckhard Denicke, Bernd Geck, Ilona Rolfeshttp://xplorestaging.ieee.org/ielx7/19/6524055/06490399.pdf?arnumber=6490399
Advances in Space Research10.1016/s0273-1177(01)00308-82001281109-116Calibration of an airborne X-band interferomettic SAR system with fine DEMH. Ohkurahttps://api.elsevier.com/content/article/PII:S0273117701003088?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:S0273117701003088?httpAccept=text/plain
Microwave and Optical Technology Letters10.1002/(sici)1098-2760(19990905)22:5<291::aid-mop1>3.0.co;2-t1999225291-292Measurement of complex permittivity of low-loss dielectric material at 94 GHz frequency band using free-space methodKenjiro Otsuka, Osamu Hashimoto, Takahisa Ishidahttps://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F(SICI)1098-2760(19990905)22:5%3C291::AID-MOP1%3E3.0.CO;2-T, https://onlinelibrary.wiley.com/doi/full/10.1002/(SICI)1098-2760(19990905)22:5%3C291::AID-MOP1%3E3.0.CO;2-T
Key Engineering Materials10.4028/www.scientific.net/kem.656-657.7742015656-657774-781Comprehensive Calibration of Structured Light Measurement System Using Planar ChessboardPing Chen, Zhi Sheng Zhang, Yuan Chao, Yi Fan Zhouhttps://www.scientific.net/KEM.656-657.774.pdf
Measurement10.1016/j.measurement.2011.10.0342012453427-430Uncertainty of calibration of 2D planar Coordinate Measuring MachineRyoshu Furutani, Miyu Ozakihttps://api.elsevier.com/content/article/PII:S0263224111003800?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:S0263224111003800?httpAccept=text/plain
Adsorption10.1007/s10450-016-9845-22016232-3249-255Influence of free-space calibration using He on the measurement of adsorption isothermsMarie Shimomura, Masayuki Yoshida, Akira Endohttp://link.springer.com/content/pdf/10.1007/s10450-016-9845-2.pdf, http://link.springer.com/article/10.1007/s10450-016-9845-2/fulltext.html, http://link.springer.com/content/pdf/10.1007/s10450-016-9845-2.pdf