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| Uncertainty of S-Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard |
| Hyunji Koo, Martin Salter, No-Weon Kang, Nick Ridler, Young-Pyo Hong |
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J Electromagn Eng Sci. 2021;21(5):369-378. Published online November 30, 2021 DOI: https://doi.org/10.26866/jees.2021.5.r.45 |
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Uncertainty of S-Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard Journal of Electromagnetic Engineering and Science. 2021;21(5):369-378  Uncertainty of VNA S-Parameter Measurement Due to Nonideal TRL Calibration Items IEEE Transactions on Instrumentation and Measurement. 2005;54(2):676-679 Influence of nonideal LRL or TRL calibration elements on VNA S-parameter measurements Advances in Radio Science. 2005;3:51-58 Sensitivity analysis of multiport S-parameter measurements due to nonideal TRL calibration standards Radio Science. 2017;52(9):1096-1105 Sensitivity Analysis of $S$-Parameter Measurements Due to Calibration Standards Uncertainty IEEE Transactions on Microwave Theory and Techniques. 2013;61(10):3800-3807 Parameter Measurements of Pantographs and Contact Line Systems Pantograph and Contact Line System. 2018;329-352 Uncertainty in wellhead protection area delineation due to uncertainty in aquifer parameter values Journal of Hydrology. 1993;149(1-4):1-8 Multi-line TRL Calibration of Vector Network Analyzers: Classical versus Tensor Implementation . 2022; Multi-line TRL Calibration of Vector Network Analyzers: Classical versus Tensor Implementation . 2022; CONSEQUENCES OF CCD IMPERFECTIONS FOR COSMOLOGY DETERMINED BY WEAK LENSING SURVEYS: FROM LABORATORY MEASUREMENTS TO COSMOLOGICAL PARAMETER BIAS The Astrophysical Journal. 2016;825(1):61 |
