PublisherDOIYearVolumeIssuePageTitleAuthor(s)Link
Journal of Electromagnetic Engineering and Science10.26866/jees.2021.5.r.452021215369-378Uncertainty of S-Parameter Measurements on PCBs due to Imperfections in the TRL Line StandardHyunji Koo, Martin Salter, No-Weon Kang, Nick Ridler, Young-Pyo Honghttp://jees.kr/upload/pdf/jees-2021-5-r-45.pdf, http://jees.kr/journal/view.php?doi=10.26866/jees.2021.5.r.45, http://jees.kr/upload/pdf/jees-2021-5-r-45.pdf
IEEE Transactions on Instrumentation and Measurement10.1109/tim.2005.8435212005542676-679Uncertainty of VNA S-Parameter Measurement Due to Nonideal TRL Calibration ItemsU. Stumperhttp://xplorestaging.ieee.org/ielx5/19/30540/01408262.pdf?arnumber=1408262
Radio Science10.1002/2017rs00638020175291096-1105Sensitivity analysis of multiport S-parameter measurements due to nonideal TRL calibration standardsM. Wang, Y. J. Zhao, Y. M. Jin, Y. G. Zhouhttps://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F2017RS006380, http://onlinelibrary.wiley.com/wol1/doi/10.1002/2017RS006380/fullpdf
Advances in Radio Science10.5194/ars-3-51-20052005351-58Influence of nonideal LRL or TRL calibration elements on VNA S-parameter measurementsU. Stumperhttps://ars.copernicus.org/articles/3/51/2005/ars-3-51-2005.pdf
IEEE Transactions on Microwave Theory and Techniques10.1109/tmtt.2013.2279774201361103800-3807Sensitivity Analysis of $S$-Parameter Measurements Due to Calibration Standards UncertaintyFriedrich Lenk, Ralf Doerner, Andrej Rumiantsevhttp://xplorestaging.ieee.org/ielx7/22/6617737/06606926.pdf?arnumber=6606926
Pantograph and Contact Line System10.1016/b978-0-12-812886-2.00009-42018329-352Parameter Measurements of Pantographs and Contact Line SystemsJiqin Wuhttps://api.elsevier.com/content/article/PII:B9780128128862000094?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:B9780128128862000094?httpAccept=text/plain
Journal of Hydrology10.1016/0022-1694(93)90095-q19931491-41-8Uncertainty in wellhead protection area delineation due to uncertainty in aquifer parameter valuesKailash Bhatthttps://api.elsevier.com/content/article/PII:002216949390095Q?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:002216949390095Q?httpAccept=text/plain
10.36227/techrxiv.18319913.v12022Multi-line TRL Calibration of Vector Network Analyzers: Classical versus Tensor ImplementationAna Buesa-Zubiria, Jaime Estebanhttps://ndownloader.figshare.com/files/33157238
10.36227/techrxiv.183199132022Multi-line TRL Calibration of Vector Network Analyzers: Classical versus Tensor ImplementationAna Buesa-Zubiria, Jaime Estebanhttps://ndownloader.figshare.com/files/33157238
The Astrophysical Journal10.3847/0004-637x/825/1/612016825161CONSEQUENCES OF CCD IMPERFECTIONS FOR COSMOLOGY DETERMINED BY WEAK LENSING SURVEYS: FROM LABORATORY MEASUREMENTS TO COSMOLOGICAL PARAMETER BIASYuki Okura, Andrea Petri, Morgan May, Andrés A. Plazas, Toru Tamagawahttp://stacks.iop.org/0004-637X/825/i=1/a=61/pdf, http://stacks.iop.org/0004-637X/825/i=1/a=61?key=crossref.ef75d4889952338e172b420152d592f9, https://iopscience.iop.org/article/10.3847/0004-637X/825/1/61/pdf