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J. Electromagn. Eng. Sci > Volume 11(1); 2011 > Article
Journal of the Korean Institute of Electromagnetic and Science 2011;11(1):62-70.
DOI: https://doi.org/10.5515/JKIEES.2011.11.1.062   
Electrical Parameter Extraction of High Performance Package Using PEEC Method
Bo Pu, Jung-Sang Lee, Wan-Soo Nah
Department of Electrical and Electronics Engineering, Sungkyunkwan University
Abstract
This paper proposes a novel electrical characterization approach for a high-performance package system using an improved Partial Element Equivalent Circuit (PEEC). As the effect of interconnects becomes a pivotal factor for the performance of high-speed electronic systems, there is a great demand for an accurate equivalent model for interconnects. In particular, an equivalent model of interconnects is established in this paper for the Fine-Pitch Ball Grid Array (FBGA) package using the improved PEEC method. Based on the equivalent model, electrical characteristics are analyzed; furthermore, these are verified through the measurement results of a Vector Network Analyzer (VNA).
Key words: Electrical Characterization, Equivalent Model, Interconnect, Package, Partial Element Equivalent Circuit
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