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- Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses
- Zhikang Yang, Lin Wen, Yudong Li, Dong Zhou, Xin Wang, Rui Ding, Meiqing Zhong, Cui Meng, Wenxiao Fang, Qi Guo
- J. Electromagn. Eng. Sci. 2024;24(2):151-160. Published online March 31, 2024
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- A Modeling and Design Methodology of Double Exponential Pulse Generator for Simulation-Based Conducted Disturbance Immunity Testing
- Jaesik Moon, Jong Hwa Kwon, Eakhwan Song
- J. Electromagn. Eng. Sci. 2023;23(3):266-274. Published online May 31, 2023
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