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Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses
Zhikang Yang, Lin Wen, Yudong Li, Dong Zhou, Xin Wang, Rui Ding, Meiqing Zhong, Cui Meng, Wenxiao Fang, Qi Guo
J. Electromagn. Eng. Sci. 2024;24(2):151-160.   Published online March 31, 2024
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A Modeling and Design Methodology of Double Exponential Pulse Generator for Simulation-Based Conducted Disturbance Immunity Testing
Jaesik Moon, Jong Hwa Kwon, Eakhwan Song
J. Electromagn. Eng. Sci. 2023;23(3):266-274.   Published online May 31, 2023
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