J Korean inst Electromagn Sci Search

CLOSE


J. Electromagn. Eng. Sci > Volume 11(1); 2011 > Article
Journal of the Korean Institute of Electromagnetic and Science 2011;11(1):56-61.
DOI: https://doi.org/10.5515/JKIEES.2011.11.1.056   
Topological Derivative for Fast Imaging of Two-Dimensional Thin Dielectric Inclusions in The Wave Propagation Environment
Won-Kwang Park
Department of Mathematics, The College of Natural Sciences, Kookmin University
Abstract
In this paper, we consider the topological derivative concept for developing a fast imaging algorithm of thin inclusions with dielectric contrast with respect to an embedding homogeneous domain with a smooth boundary. The topological derivative is evaluated by applying asymptotic expansion formulas in the presence of small, perfectly conducting cracks. Through the careful derivation, we can design a one-iteration imaging algorithm by solving an adjoint problem. Numerical experiments verify that this algorithm is fast, effective, and stable.
Key words: Asymptotic Expansion Formula, Non-Iterative Imaging, Thin Dielectric Inclusions, Topological Derivative
TOOLS
Share :
Facebook Twitter Linked In Google+
METRICS Graph View
  • 2 Crossref
  •   
  • 1,788 View
  • 5 Download
Related articles in JEES

ABOUT
ARTICLE CATEGORY

Browse all articles >

BROWSE ARTICLES
AUTHOR INFORMATION
Editorial Office
#706 Totoo Valley, 217 Saechang-ro, Yongsan-gu, Seoul 04376, Korea
Tel: +82-2-337-9666    Fax: +82-2-6390-7550    E-mail: admin-jees@kiees.or.kr                

Copyright © 2024 by The Korean Institute of Electromagnetic Engineering and Science.

Developed in M2PI

Close layer
prev next